Kinetics of vacancy diffusion on Si(111) surfaces studied by scanning reflection electron microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 8, 1996, Pages 5574-5580

  Watanabe, Heiji ^a   Ichikawa, Masakazu ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001100299     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.5574     Document Type: Article

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