Initial stage of layer-by-layer sputtering of Si(111) surfaces studied by scanning reflection electron microscopy

Applied Physics Letters

Volumn 68, Issue 18, 1996, Pages 2514-2516

  Watanabe, Heiji ^a   Ichikawa, Masakazu ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001514158     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115839     Document Type: Article

References (8)

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