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Volumn 55, Issue 5, 1997, Pages 2863-2866
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Optically detected magnetic resonance studies of defects in electron-irradiated 3C SiC layers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001082386
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.55.2863 Document Type: Article |
Times cited : (40)
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References (17)
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