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Volumn 55, Issue 5, 1997, Pages 2863-2866

Optically detected magnetic resonance studies of defects in electron-irradiated 3C SiC layers

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EID: 0001082386     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.2863     Document Type: Article
Times cited : (40)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.