Mechanism for photon emission from Au nano-hemispheres induced by scanning tunneling microscopy

Applied Physics Letters

Volumn 74, Issue 26, 1999, Pages 3966-3968

  Liau, Yish Hann ^a   Scherer, Norbert F ^a  

^a UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001073114     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124238     Document Type: Article

References (26)

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23. Film thickness was determined by a calibrated quartz microbalance.
24. The root-mean-square roughness of the substrate is measured to be less than 0.6 nm by AFM, hence a small contribution.
25. To the best of our knowledge, no experimental value of photon creation efficiency for Au films has been reported before.
26. F is the Fermi velocity, Ω is the resonance frequency of the surface plasmon mode of the metal particle, V is the bias voltage, W is the barrier height, and C is a constant. In Ref. 22, the authors indicated that the constant C is on the order of unity; the best fit to the experimental data is obtained with C = 0.5.