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Volumn 58, Issue 16, 1998, Pages 10990-10999

Arsenic redistribution at the interface during oxidation of implanted silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001073113     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.10990     Document Type: Article
Times cited : (16)

References (25)
  • 10
    • 0003679027 scopus 로고    scopus 로고
    • M. D. Giles, in VLSI Technology, edited by S. M. Sze (McGraw-Hill, New York, 1988), p. 356.
    • (1988) VLSI Technology , pp. 356
    • Giles, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.