Thermoelectric characterization of Si thin films in silicon-on-insulator wafers

Journal of Applied Physics

Volumn 86, Issue 6, 1999, Pages 3204-3208

  Liao, C N ^a   Chen, C ^a   Tu, K N ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001002880     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371190     Document Type: Article

References (12)

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