X-ray reflectivity study of layering transitions and the internal multilayer structure of films of three-block organosiloxane amphiphilic smectic liquid crystals at the air-water interface

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 56, Issue 2, 1997, Pages 1844-1852

  Ibn Elhaj, M ^a   Riegler, H ^a   Mohwald H ^a   Schwendler, M ^b   Helm, C A ^c  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000988978     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.56.1844     Document Type: Article

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