Phase transition behavior of BaTiO3 thin films using high-temperature x-ray diffraction

Journal of Applied Physics

Volumn 86, Issue 8, 1999, Pages 4555-4558

  Li, Chunling ^a   Chen, Zhenghao ^a   Cui, Dafu ^a   Zhou, Yueliang ^a   Lu, Huibin ^a   Dong, Cheng ^a   Wu, Fei ^a   Chen, Hong ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000977551     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371402     Document Type: Article

References (11)

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