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Volumn 61, Issue 24, 2000, Pages 16967-16971

Temperature dependence of silicon carbide interface formation: A photoelectron spectroscopy study

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[No Author keywords available]

Indexed keywords


EID: 0000976568     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.16967     Document Type: Article
Times cited : (20)

References (25)
  • 7
    • 0000174033 scopus 로고
    • R.-C. Fang and L. Ley, Phys. Rev. B 40, 3818 (1989).
    • (1989) Phys. Rev. B , vol.40 , pp. 3818
    • Ley, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.