Field emission measurements with μm resolution on chemical-vapor-deposited polycrystalline diamond films

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 3, 1996, Pages 2056-2059

  Pupeter, N ^a   Gohl A ^a   Habermann, T ^a   Mahner, E ^a   Muller G ^a   Piel, H ^a   Niedermann, Ph ^b   Hanni W ^b  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b CSEM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001426993     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588985     Document Type: Article

References (12)

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8. M. Binggeli, J.-P. Dan, A. Grisel, W. Haenni, H. E. Hintermann, P. Krebs, and C. Mueller, in Proceedings of the 2nd International Conference on the Applications of Diamond Films and Related Materials, edited by M. Yoshikawa et al. (MYO, Tokyo, 1993).
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10. W. A. Mackie and A. E. Bell, in Proceedings of the 8th International Vacuum Microelectronics Conference, Portland, OR, 1995 (unpublished), p. 350.
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