Enhanced X-ray emission in the 1-keV range from a laser-irradiated gas puff target produced using the double-nozzle setup

Applied Physics B: Lasers and Optics

Volumn 70, Issue 2, 2000, Pages 305-308

  Fiedorowicz, H ^a   Bartnik, A ^a   Jarocki, R ^a   Rakowski, R ^a   Szczurek, M ^a  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000951834     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003400050050     Document Type: Article

References (6)

1. H. Fiedorowicz, A. Bartnik, P. Parys. Z. Patron: X-ray Optics and Microanalysis 1992 (IOP Publishing, Bristol 1992) p. 515
2. H. Fiedorowicz, A. Bartnik, Z. Patron, P. Parys: Appl. Phys. Lett. 62, 2778 (1993)
3. P. Celliers, L.B. DaSilva, C.B. Dane, S. Mrowka, M. Norton, J. Harder, L.A. Hackel, D.L. Matthews, H. Fiedorowicz, A. Bartnik, J.R. Maldonado, J.A. Abate: J. Appl. Phys. 79, 8258 (1996)
4. H. Fiedorowicz, A. Bartnik, J. Kostecki, M. Szczurek: Electron-Beam, X-ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing VI, Proc. SPIE, Vol. 2723, ed. by D.E. Seager (SPIE, Bellingham 1996) p. 310
5. H. Fiedorowicz, A. Bartnik, R. Jarocki, M. Szczurek, T. Wilhein: Appl. Phys. B 67, 391 (1998)
6. H. Fiedorowicz, A. Bartnik, M. Szczurek, H. Daido, N. Sakaya, V. Kmetik, Y. Kato, M. Suzuki, M. Matsumura, J. Tajima, T. Nakayama, T. Wilhein: Opt. Commun. 163, 103 (1999)