A statistical approach to the inspection checklist formal synthesis and improvement

IEEE Transactions on Software Engineering

Volumn 22, Issue 12, 1996, Pages 866-874

  Chernak, Yuri ^a,b  

^a IEEE   (United States)

^b NONE   (United States)

Author keywords

Defect causal analysis; Defect modeling; Inspection checklist; Software inspection; Software testing

Indexed keywords

EID: 0000948661     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/32.553635     Document Type: Article

References (13)

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