Orthogonal Defect Classification—A Concept for In-Process Measurements

IEEE Transactions on Software Engineering

Volumn 18, Issue 11, 1992, Pages 943-956

  Chillarege, Ram ^a   Bhandari, Inderpal S ^a   Chaar, Jarir K ^a   Halliday, Michael J ^a   Ray, Bonnie K ^a   Moebus, Diane S ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM Mid Hudson Valley Programming Lab ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); DEFECTS; MEASUREMENTS;

IN-PROCESS MEASUREMENTS; SOFTWARE DEVELOPMENT;

SOFTWARE ENGINEERING;

EID: 0026944574     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/32.177364     Document Type: Article

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