Geometry effects on the van der Waals force in atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 7, 1997, Pages 4159-4165

  Johansson, Peter ^a   Apell, Peter ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000894489     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.4159     Document Type: Article

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