Nucleation barrier of voids and dislocation loops in silicon

Applied Physics Letters

Volumn 70, Issue 13, 1997, Pages 1715-1717

  Tan, T Y ^a   Plekhanov, P ^a   Gosele U M ^a  

^a Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000886733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118652     Document Type: Article

References (24)

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