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Applied Physics Letters

Volumn 70, Issue 7, 1997, Pages 838-840

X-ray diffraction study of alternating nanocrystalline silicon/amorphous silicon multilayers

(7) Wu, X L a Tong, S a Liu, X N a Bao, X M a Jiang, S S a Feng, D a Siu, G G b

a NANJING UNIVERSITY (China)

b CITY UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000862453 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.118219 Document Type: Article

Times cited : (26)

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