Raman scattering of porous structure formed on C+-implanted silicon

Applied Physics Letters

Volumn 68, Issue 15, 1996, Pages 2091-2093

  Wu, Xing Long ^a   Yan, Feng ^a   Bao, Xi Mao ^a   Li, Ning Sheng ^a   Liao, Liang Sheng ^a   Zhang, Ming Sheng ^a   Jiang, Shu Sheng ^a   Feng, Duan ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; GAS LASERS; GRAIN SIZE AND SHAPE; ION IMPLANTATION; LUMINESCENCE; MATHEMATICAL MODELS; PHONONS; POROUS MATERIALS; SEMICONDUCTING SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ARGON LASERS; BLUE EMISSION; CRYSTALLITE SIZE; FULL WIDTH AT HALF MAXIMUM; PHONON CONFINEMENT;

RAMAN SCATTERING;

EID: 0030574957     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115594     Document Type: Article

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