Quantization test of a hall device by ac measurements of the longitudinal resistance

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 1996, Pages 255-256

  Cabiati, F ^a   Capra, P P ^a   Marullo Reedtz, G ^a   Sosso, A ^a   Rinaudo, G ^a  

^a ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DIGITAL VOLTMETERS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC RESISTANCE; ELECTRIC TRANSFORMERS; EQUIVALENT CIRCUITS; HETEROJUNCTIONS; RESISTORS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE TESTING;

PHASE SENSITIVE DETECTORS; PRECISION DIFFERENTIAL PREAMPLIFIERS; PROGRAMMABLE INSTRUMENTS; TWO DIMENSIONAL ELECTRON GAS; UNITY GAIN AMPLIFIER; VOLTAMPEROMETRIC MEASUREMENT;

HALL EFFECT DEVICES;

EID: 0029772990     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)