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Volumn 12, Issue 4, 1999, Pages 585-590
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On the roadmap, off the roadmap, beyond the roadmap for lithography
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Author keywords
ArF excimer laser; Electron beam direct writing; Extreme ultraviolet; Lithography; Mask; Proximity X ray; Resist; Vacuum ultraviolet
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Indexed keywords
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EID: 0000762504
PISSN: 09149244
EISSN: None
Source Type: Journal
DOI: 10.2494/photopolymer.12.585 Document Type: Article |
Times cited : (13)
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References (7)
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