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Volumn 72, Issue 8, 1998, Pages 954-956
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A reflection high-energy electron diffraction and atomic force microscopy study of the chemical beam epitaxial growth of InAs and InP islands on (001) GaP
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000678242
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120883 Document Type: Article |
Times cited : (37)
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References (11)
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