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Applied Physics Letters

Volumn 78, Issue 7, 2001, Pages 907-909

Stacking fault effects in pure and n-type doped gaas

(3) Schmidt, T M a Justo, J F b Fazzio, A b

a FEDERAL UNIVERSITY OF UBERLÂNDIA (Brazil)

b UNIVERSITY OF SÃO PAULO (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000671128 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1347005 Document Type: Article

Times cited : (13)

References (18)

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