Defects in metamorphic InxAl1-xAs (x<0.4) epilayers grown on GaAs substrates

Journal of Applied Physics

Volumn 82, Issue 1, 1997, Pages 210-213

  Shieh, Jia Lin ^a   Chang, Mao Nan ^a   Cheng, Yung Shih ^a   Chyi, Jen Inn ^a  

^a NATIONAL CENTRAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000655734     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365799     Document Type: Article

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