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note
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Analogous experiments have been carried out for Si(100) samples etched in dilute HF (10%) prior to contact bonding, and a 1 × 1 diffraction pattern of comparable quality was obtained.
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10
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85033318877
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note
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By Auger electron spectroscopy, we were not able to detect oxygen or fluorine on the samples, implying less than 2% coverage of these contaminants. A significant carbon signal was detected, consistent with other studies of HF-passivated surfaces.
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