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Volumn 39, Issue 13, 2000, Pages 2078-2080

Phase retardometer: A proposed device for measuring phase retardance

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; CALIBRATION; ELLIPSOMETRY; LIGHT POLARIZATION; MATRIX ALGEBRA; OPTICAL SYSTEMS; PHASE SHIFT;

EID: 0000634674     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002078     Document Type: Article
Times cited : (21)

References (10)
  • 1
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    • The calibration of quarter-wave plates
    • H. G. Jerrard, “The calibration of quarter-wave plates, ” J. Opt. Soc. Am. 42, 159-165 (1952).
    • (1952) J. Opt. Soc. Am. , vol.42 , pp. 159-165
    • Jerrard, H.G.1
  • 2
    • 0003069254 scopus 로고
    • Polarization
    • W. G. Driscoll, ed. (McGraw-Hill, New York, Chap
    • J. M. Bennett and H. E. Bennett, “Polarization, ” in Handbook of Optics, W. G. Driscoll, ed. (McGraw-Hill, New York, 1978), Chap. 10, pp. 129-140.
    • (1978) Handbook of Optics , vol.10 , pp. 129-140
    • Bennett, J.M.1    Bennett, H.E.2
  • 3
    • 0037942477 scopus 로고
    • Ellipsometry using a retardation plate as compensator
    • W. G. Oldham, “Ellipsometry using a retardation plate as compensator, ” J. Opt. Soc. Am. 57, 617-624 (1967).
    • (1967) J. Opt. Soc. Am. , vol.57 , pp. 617-624
    • Oldham, W.G.1
  • 4
    • 0014719901 scopus 로고
    • Analyses and corrections of instrumental errors in ellipsometry
    • F. L. McCrackin, “Analyses and corrections of instrumental errors in ellipsometry, ” J. Opt. Soc. Am. 60, 57-63 (1970).
    • (1970) J. Opt. Soc. Am. , vol.60 , pp. 57-63
    • McCrackin, F.L.1
  • 5
    • 0038618618 scopus 로고
    • Phase plates in the measurement of phase difference
    • Kh. K. Aben, “Phase plates in the measurement of phase difference, ” Opt. Spectrosc. (USSR) 14, 124-127 (1963).
    • (1963) Opt. Spectrosc. (USSR) , vol.14 , pp. 124-127
    • Aben, K.K.1
  • 6
    • 0014072445 scopus 로고
    • Formulas for using wave plates in ellipsometry
    • D. A. Holmes and D. L. Feucht, “Formulas for using wave plates in ellipsometry, ” J. Opt. Soc. Am. 57, 466-472 (1967).
    • (1967) J. Opt. Soc. Am. , vol.57 , pp. 466-472
    • Holmes, D.A.1    Feucht, D.L.2
  • 7
    • 0038618617 scopus 로고
    • General equations of symmetrical ellipsometer arrangements
    • J. A. Johnson and N. M. Bashara, “General equations of symmetrical ellipsometer arrangements, ” J. Opt. Soc. Am. 60, 221-224 (1970).
    • (1970) J. Opt. Soc. Am. , vol.60 , pp. 221-224
    • Johnson, J.A.1    Bashara, N.M.2
  • 8
    • 84965025321 scopus 로고
    • (Harvard U. Press, Cambridge, Mass
    • W. A. Shurcliff, Polarized Light (Harvard U. Press, Cambridge, Mass., 1962), pp. 165-170.
    • (1962) Polarized Light , pp. 165-170
    • Shurcliff, W.A.1
  • 10
    • 0037942476 scopus 로고    scopus 로고
    • Uncertainty in null polarimeter measurements
    • National Institute of Standards and Technology, Boulder, Colo
    • K. B. Rochford and C. M. Wang, “Uncertainty in null polarimeter measurements, ” Internal Tech. Rep. 5055 (National Institute of Standards and Technology, Boulder, Colo., 1996).
    • (1996) Internal Tech. Rep , vol.5055
    • Rochford, K.B.1    Wang, C.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.