Birefringence of muscovite mica

Optics and Laser Technology

Volumn 30, Issue 6, 1998, Pages 411-415

  El Bahrawi, M S ^a   Nagib, N N ^a   Khodier, S A ^a   Sidki, H M ^a  

^a NATIONAL INSTITUTE FOR STANDARDS   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MICA; PRISMS; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

MUSCOVITE MICA; PHASE PLATE;

BIREFRINGENCE;

EID: 0004130522     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(98)00074-7     Document Type: Article

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