Realization of an axially aligned Au-ion source of atomic size

Applied Physics Letters

Volumn 75, Issue 9, 1999, Pages 1332-1334

  Purcell, S T ^a   Binh, Vu Thien ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000610261     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124684     Document Type: Article

References (9)

1. See E. Muller and T. T. Tsong, Field Ion Microscopy, Principles and Applications (Elsevier, Amsterdam, 1969).
2. S. Kalbitzer, Ch. Wilbertz, Th. Miller, and A. Knoblauch, Nucl. Instrum. Methods Phys. Res. B 113, 154 (1996); S. Kalbitzer and A. Knoblauch, J. Vac. Sci. Technol. B 16, 2455 (1998).
3. S. Kalbitzer, Ch. Wilbertz, Th. Miller, and A. Knoblauch, Nucl. Instrum. Methods Phys. Res. B 113, 154 (1996); S. Kalbitzer and A. Knoblauch, J. Vac. Sci. Technol. B 16, 2455 (1998).
4. For a recent review, see L. W. Swanson, Appl. Surf. Sci. 76/77, 80 (1994), and references therein.
5. J. Vac. Sci. Technol. B 16, 2438 (1998).
6. V. T. Binh and N. Garcia, J. Phys. I 1, 605 (1991); see also V. T. Binh, N. Garcia, and S. T. Purcell, in Advances in Imaging and Electron Physics, edited by H. W. Hawkes (Academic, New York, 1996), Vol. 95, Chap. 2, pp. 63-153.
7. V. T. Binh and N. Garcia, J. Phys. I 1, 605 (1991); see also V. T. Binh, N. Garcia, and S. T. Purcell, in Advances in Imaging and Electron Physics, edited by H. W. Hawkes (Academic, New York, 1996), Vol. 95, Chap. 2, pp. 63-153.
8. R. J. Culbertson, G. H. Robertson, and T. Sakurai, J. Vac. Sci. Technol. 16, 1868 (1979).
9. V. T. Binh, V. Semet, D. Guillot, P. Legagneux, and Dd. Pribat, Appl. Phys. Lett. 73, 2048 (1998).