SCOPUS 정보 검색 플랫폼

Optics and Laser Technology

Volumn 28, Issue 3, 1996, Pages 157-162

Non-destructive evaluation of materials at high temperatures using electro-optic holography

(1) Bhat, G K a

a Strainoptic Technologies Inc (United States)

Author keywords

Digital fringe analysis; Electro optic holography; High temperature testing; Non destructive evaluation

Indexed keywords

CHARGE COUPLED DEVICES; COMPRESSION TESTING; DEFORMATION; ELECTROOPTICAL DEVICES; HIGH TEMPERATURE OPERATIONS; IMAGE PROCESSING; LASER BEAMS; MATERIALS TESTING; NONDESTRUCTIVE EXAMINATION; STRAIN MEASUREMENT; SUPERALLOYS; VISUALIZATION;

ELECTROOPTICAL HOLOGRAPHY; IN PLANE DISPLACEMENT FRINGES;

HOLOGRAPHIC INTERFEROMETRY;

EID: 0030127116 PISSN: 00303992 EISSN: None Source Type: Journal
DOI: 10.1016/0030-3992(95)00086-0 Document Type: Article

Times cited : (3)

References (8)

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2
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7
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.