Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing

Applied Physics Letters

Volumn 77, Issue 17, 2000, Pages 2719-2721

  Lim, P S ^a   Chim, W K ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000521425     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1320041     Document Type: Article

References (8)

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