Performance of corrugated quantum well infrared photodetectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3379, Issue , 1998, Pages 441-452

  Choi, Kwong Kit ^a   Chen, C J ^b   Goldberg, Arnold C ^a   Chang, Wayne H ^a   Tsui, Daniel C ^b  

^a U S ARMY RESEARCH LABORATORY   (United States)

^b Princeton University   (United States)

Author keywords

Focal plane array; Infrared detector; Optical coupling; Quantum wells

Indexed keywords

DETECTORS; FOCAL PLANE ARRAYS; FOCUSING; LIGHT REFLECTION; OPTOELECTRONIC DEVICES; PHOTODETECTORS; REFRACTIVE INDEX; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES; THICKNESS MEASUREMENT; WELLS;

COLOR DETECTION; CURRENT RATIOS; CUT OFF WAVELENGTHS; ELECTRON TRANSISTORS; FOCAL PLANE ARRAY; INCIDENT LIGHT; INFRARED DETECTOR; NON UNIFORMITIES; OPTICAL COUPLING; QUANTUM WELLS; QWIP TECHNOLOGY; TOTAL INTERNAL REFLECTION (TIR);

INFRARED DETECTORS;

EID: 0000481026     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317612     Document Type: Conference Paper

References (11)

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