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Volumn 89, Issue 2, 2001, Pages 980-987
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Studies of boron diffusivity in strained Si1 - xGex epitaxial layers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000476732
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1332803 Document Type: Article |
Times cited : (40)
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References (22)
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