Substitutional carbon in Si1-xGex

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 19, 1999, Pages 13573-13581

  Hoffmann, L ^a   Bech Nielsen, B ^a   Nylandsted Larsen, A ^a   Leary, P ^b   Jones, R ^b   Briddon, P R ^c   Oberg S ^d  

^a AARHUS UNIVERSITY   (Denmark)

^b UNIVERSITY OF EXETER   (United Kingdom)

^c NEWCASTLE UNIVERSITY   (United Kingdom)

^d LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000476017     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (23)

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17. Alternatively, we could have chosen Lorentz or Voigt profiles. However, Lorentzian profiles do not fit the observed line shape as well as Gaussian profiles. Voigt profiles give fits of the same quality as the Gaussian profiles. Also the intensities determined for the individual lines from Gaussian- and Voigt-profile fits differ by less than 10%. Gaussian profiles were chosen since they are mathematically simpler than Voigt profiles.
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