Production and characterization of Ti:sapphire thin films grown by reactive laser ablation with elemental precursors

Optics Letters

Volumn 24, Issue 22, 1999, Pages 1581-1583

  Willmott, P R ^a   Manoravi, P ^a   Huber, J R ^a   Greber, T ^b   Murray, Tracey A ^c   Holliday, Keith ^d  

^a UNIVERSITY OF ZURICH   (Switzerland)

^b PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^c UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^d UNIVERSITY OF SAN FRANCISCO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000475250     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.001581     Document Type: Article

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