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Volumn 73, Issue 11, 1998, Pages 1520-1522
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Comparison between optical techniques for the measurement of the surface electric field in (100) oriented GaAs
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000475197
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.122192 Document Type: Article |
Times cited : (13)
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References (14)
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