Soft X-ray studies of a c(4 × 2)* β-SiC(100) surface

Surface Science

Volumn 349, Issue 3, 1996, Pages 317-332

  Shek, M L ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Low energy electron diffraction; Semiconducting surfaces; Silicon carbide; Soft X ray photoelectron spectroscopy; Stepped single crystal surfaces; Surface electronic phenomena

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING SILICON; SILICON CARBIDE; SINGLE CRYSTALS; SURFACE PHENOMENA; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

SOFT X RAY PHOTOELECTRON SPECTROSCOPY; SURFACE RECONSTRUCTION;

SURFACE STRUCTURE;

EID: 0030128599     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01047-5     Document Type: Article

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