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Volumn 68, Issue 19, 1996, Pages 2678-2680

Growth defects in GaN films on 6H-SiC substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000464763     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116279     Document Type: Article
Times cited : (73)

References (11)
  • 10
    • 21544444212 scopus 로고    scopus 로고
    • P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965).
    • P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965).
  • 11
    • 0030108963 scopus 로고    scopus 로고
    • X. J. Ning, F. R. Chien, P. Pirouz, J. Yang, and M. A. Khan, J. Mater. Res. 11, 580 (1996).
    • X. J. Ning, F. R. Chien, P. Pirouz, J. Yang, and M. A. Khan, J. Mater. Res. 11, 580 (1996).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.