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note
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The X-ray diffraction patterns were recorded by employing a Rigaku X-ray diffractometer (Model-2028, Cu Kα). IR spectra were recorded using a Nicolet (impact 410) FT-IR spectrometer, using transparent pellets of the compounds in KBr matrixes. The transmission electron micrographs were obtained by employing a JEOL-JEM 100SX electron microscope. The photoluminescence spectrum was obtained using an Perkin-Elmer luminescence spectrophotometer (model LS50B). The excitation wavelength was 260 nm. The UV-visible absorbance spectrum of the silicon was obtained using a Varian (model-DMS 100S) UV-visible spectrophotometer. ESR spectra were recorded on a Bruker ER 083 CS spectrometer, operating at X-band frequency (v = 9.7 GHz), with a 100 kHz magnetic field modulation.
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Because of the rapid thermal quenching and interparticle collisions associated with the acoustic cavitation, a large amount of surface defect concentration is likely to be present in the sonochemical product. See Suslick, K. S. Sci. Am. 1989, 111, 2342.
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