Inhomogeneity of anodic oxide films of Al and Al alloys characterized by scanning electron microscopy observation and analysis of frequency response behavior

Journal of Applied Physics

Volumn 85, Issue 3, 1999, Pages 1883-1894

  Ozawa, Kiyoshi ^a   Majima, Teiji ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000454334     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369313     Document Type: Article

References (12)

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