Absolute detector calibration applied to nonlinearity error correction in FT-IR measurements

Applied Spectroscopy

Volumn 51, Issue 4, 1997, Pages 576-579

  Zhang, Z M ^a   Zhu, C J ^b   Hanssen, L M ^c  

^a UNIVERSITY OF FLORIDA   (United States)

^b UNIVERSITY OF IDAHO   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Detector responsivity calibration; FT IR spectrometer; Nonlinearity correction; Transmittance

Indexed keywords

CALIBRATION; INSTRUMENT ERRORS; LIGHT TRANSMISSION; MERCURY COMPOUNDS; PHOTODETECTORS; PHOTONS; SEMICONDUCTOR LASERS; SILICON WAFERS; SPECTROMETERS;

DETECTOR RESPONSIVITY CALIBRATION; DEUTERATED TRIGLYCINE SULFATE DETECTORS; NONLINEARITY ERROR CORRECTION;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0031122876     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971940639     Document Type: Article

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