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Volumn 59, Issue 23, 1999, Pages 15214-15224

Mass effects on regrowth rates and activation energies of solid-phase epitaxy induced by ion beams in silicon

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Indexed keywords


EID: 0000406397     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.15214     Document Type: Article
Times cited : (30)

References (52)
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    • (1987) MRS Symposia Proceedings , pp. 327
    • Jacobson, D.C.1    Elliman, R.G.2    Gibson, J.M.3    Olson, G.L.4    Poate, J.M.5    Williams, J.S.6
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    • No. 45 (Ion Beam Processes in Advanced Electronic Materials and Device Technology, Materials Research Society B. R. Appleton, F. H. Eisen, and T. W. Sigmon
    • J. S. Williams, W. L. Brown, R. G. Elliman, R. V. Knoell, D. M. Maher, and T. E. Seidel, in Ion Beam Processes in Advanced Electronic Materials and Device Technology, edited by B. R. Appleton, F. H. Eisen, and T. W. Sigmon, MRS Symposia Proceedings No. 45 (Materials Research Society, Pittsburgh, 1985), p. 79.
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    • Irradiation of different ion species with different Sn values changes nuclear energy deposition rates. When a dose rate is constant, the nuclear energy deposition rate is proportional to Sn. Hence the (Formula presented) curve in Fig. 22 has the same meaning as the (Formula presented) curve.
    • Irradiation of different ion species with different Sn values changes nuclear energy deposition rates. When a dose rate is constant, the nuclear energy deposition rate is proportional to Sn. Hence the (Formula presented) curve in Fig. 22 has the same meaning as the (Formula presented) curve.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.