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Volumn 71, Issue 3, 1997, Pages 368-370

Surface morphology of GaN films determined from quantitative x-ray reflectivity

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000404369     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119539     Document Type: Article
Times cited : (13)

References (22)
  • 1
    • 0004192587 scopus 로고
    • World Scientific, Singapore
    • For a review of fractal description of surfaces, see Dynamics of Fractal Surfaces, edited by F. Family and T. Vicsek (World Scientific, Singapore, 1991).
    • (1991) Dynamics of Fractal Surfaces
    • Family, F.1    Vicsek, T.2
  • 18
    • 0000332714 scopus 로고
    • France
    • S. K. Sinha, J. Phys. (France) III 4, 1543 (1994).
    • (1994) J. Phys. , vol.4 III , pp. 1543
    • Sinha, S.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.