Chemical mapping by energy-filtering transmission electron microscopy

Journal of Electron Microscopy

Volumn 45, Issue 4, 1996, Pages 317-320

  Kurata, Hiroki ^a   Isoda, Seiji ^b   Kobayashi, Takashi ^b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Chemical mapping; EELS; EFTEM; Elemental map; ELNES

Indexed keywords

CHROMIUM COMPOUNDS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; FILMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAD COMPOUNDS; MAPPING; OXYGEN;

CHEMICAL MAPPING; CHEMICAL MAPS; EFTEM; ELEMENTAL MAPS; ELNES; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; FINE STRUCTURES; FINE-PARTICLES; MICROSCOPY TECHNIQUE; PROPERTY;

SILICA;

EID: 0000384883     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023449     Document Type: Article

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