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Volumn 86, Issue 10, 1999, Pages 5515-5519

Ion channeling and x-ray diffraction studies of epitaxial Fe on GaAs(001)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000383486     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371553     Document Type: Article
Times cited : (15)

References (18)
  • 4
    • 0001532921 scopus 로고
    • G. A. Prinz, Science 250, 1092 (1990).
    • (1990) Science , vol.250 , pp. 1092
    • Prinz, G.A.1
  • 10
    • 0004198677 scopus 로고
    • Academic, New York
    • L. C. Feldman, J. W. Mayer, and S. T. Picraux, Materials Analysis by Ion Channeling (Academic, New York, 1982); W. K. Chu, J. W. Mayer, and M. A. Nicolet, Backscattering Spectrometry (Academic, New York, 1987).
    • (1987) Backscattering Spectrometry
    • Chu, W.K.1    Mayer, J.W.2    Nicolet, M.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.