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Volumn 74, Issue 3, 1999, Pages 475-477

Determination of built-in field by applying fast Fourier transform to the photoreflectance of surface-intrinsic n+-type doped GaAs

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000377102     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123040     Document Type: Article
Times cited : (11)

References (14)
  • 2
    • 0001720790 scopus 로고
    • edited hy T. S. Moss North-Holland, New York
    • D. E. Aspnes, in Handbook on Semiconductors, edited hy T. S. Moss (North-Holland, New York, 1980), Vol. 2, p. 109.
    • (1980) Handbook on Semiconductors , vol.2 , pp. 109
    • Aspnes, D.E.1
  • 3
    • 0003568126 scopus 로고
    • edited by M. Balkanski North-Holland, New York
    • F. H. Pollak, in Handbook on Semiconductors, edited by M. Balkanski (North-Holland, New York, 1994).
    • (1994) Handbook on Semiconductors
    • Pollak, F.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.