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Volumn 74, Issue 3, 1999, Pages 475-477
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Determination of built-in field by applying fast Fourier transform to the photoreflectance of surface-intrinsic n+-type doped GaAs
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000377102
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.123040 Document Type: Article |
Times cited : (11)
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References (14)
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