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Volumn 56, Issue 8, 1997, Pages 4614-4619
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Electron-paramagnetic-resonance study of silver-induced defects in silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000372423
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.56.4614 Document Type: Article |
Times cited : (8)
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References (30)
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