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Volumn 56, Issue 8, 1997, Pages 4614-4619

Electron-paramagnetic-resonance study of silver-induced defects in silicon

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Indexed keywords


EID: 0000372423     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.4614     Document Type: Article
Times cited : (8)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.