Fabrication and characterization of nanoscale arrays of nickel columns

Journal of Applied Physics

Volumn 81, Issue 8 PART 2A, 1997, Pages 4730-4732

  O'Barr, R ^a   Yamamoto, S Y ^a,c   Schultz, S ^a   Xu, Weihua ^b   Scherer, A ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b California Institute of Technology   (United States)

^c Phase Metrics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000370775     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365444     Document Type: Article

References (12)

1. S. Y. Chou, P. R. Krauss, and L. Kong, J. Appl. Phys. 79, 6101 (1996).
2. W. Xu, J. Wong, C. C. Cheng, R. Johnson, and A. Scherer, J. Vac. Sci. Technol. B 13, 2372 (1995).
3. A. Fernandez, P. J. Bedrossian, S. P. Vernon, and D. R. Kania, IEEE Trans. Magn. 32, 4472 (1996).
4. J. F. Smyth, S. Schultz, D. R. Fredkin, D. P. Kern, S. A. Rishton, H. Schmid, M. Cali, and T. R. Koehler, J. Appl. Phys. 69, 5262 (1991).
5. M. Lederman, G. A. Gibson, and S. Schultz, J. Appl. Phys. 73, 6961 (1993).
6. M. S. Wei and S. Y. Chou, J. Appl. Phys. 76, 6679 (1994); L. Kong and S. Y. Chou, ibid. 79, 5067 (1996).
7. M. S. Wei and S. Y. Chou, J. Appl. Phys. 76, 6679 (1994); L. Kong and S. Y. Chou, ibid. 79, 5067 (1996).
8. R. M. H. New, R. F. W. Pease, R. L. White, R. M. Osgood, and K. Babcock, J. Appl. Phys. 79, 5851 (1996).
9. R. O'Barr and S. Schultz, J. Appl. Phys. 81, these proceedings.
10. P. R. Krauss and S. Y. Chou, J. Vac. Sci. Technol. B 13, 2850 (1995).
11. S. Y. Yamamoto and S. Schultz, Appl. Phys. Lett. 69, 3263 (1996).
12. S. Y. Yamamoto and S. Schultz, J. Appl. Phys. 81, these procedings.