Critical thickness of crystallization and discontinuous change in ferroelectric behavior with thickness in ferroelectric polymer thin films

Journal of Applied Physics

Volumn 89, Issue 5, 2001, Pages 2613-2616

  Zhang, Q M ^a   Xu, Haisheng ^a   Fang, Fei ^a   Cheng, Z Y ^a   Xia, Feng ^a   You, H ^b  

^a The Pennsylvania State University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000354550     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1344585     Document Type: Article

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