Investigation of electrical breakdown properties in curved electrodes

Physics of Plasmas

Volumn 7, Issue 11, 2000, Pages 4748-4754

  Uhm, Han S ^a  

^a Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000343353     PISSN: 1070664X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1310621     Document Type: Article

References (13)

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