Multiple-scattering EXAFS and EXELFS of titanium aluminum alloys

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 3, 2000, Pages 1723-1732

  Sikora, T ^a   Hug, G ^a   Jaouen, M ^b   Rehr, J ^b  

^a CNRS   (France)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000317929     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.1723     Document Type: Article

References (33)

1. C. MacCullough, J. J. Valencia, C. G. Levi, and R. Mehrabian, Acta Metall. 37, 1321 (1989).
2. M. Jaouen, T. Sikora, G. Hug, and M.G. Walls, J. Phys. IV 10, 79 (2000).
3. S. I. Zabinsky, J. J. Rehr, A. L. Ankudinov, R. C. Albers, and M. J. Eller, Phys. Rev. B 52, 2995 (1995).
4. G. Hug and E. Fries, in Gamma Titanium Aluminides, edited by D. M. Dimiduk, and M. H. Loretto, Y.-W. Kim (Minerals, Metals and Materials Soc., Warrendale, PA, 1999), p. 125.
5. R. G. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986).
6. W. Gudat and C. Kunz, Phys. Rev. Lett. 29, 169 (1972).
7. J. Mimault, J. J. Faix, T. Girardeau, M. Jaouen, and G. Tourillon, Meas. Sci. Technol. 5, 482 (1994).
8. G. Blanche, G. Hug, M. Jaouen, and A.-M. Flank, Ultramicroscopy 50, 141 (1993).
9. G. Hug, G. Blanche, M. Jaouen, A.-M. Flank, and J. J. Rehr, Ultramicroscopy 59, 121 (1995).
10. J. Wong, G. George, J. Pickering, Z. Rek, M. Rowen, T. Tanaka, G. Via, and G. E. Brown Jr., Solid State Commun. 92, 559 (1994).
11. S. L. M. Schroeder, G. D. Moggridges, R. M. Lambert, and T. Rayment, J. Phys. IV C2 7, 91 (1997).
12. A. Erbill, G. S. Cargill III, R. Frahm, and R. F. Boehme, Phys. Rev. B 37, 2450 (1988).
13. W. T. Elam, J. P. Kirland, R. A. Neiser, and P. O. Wolf, Phys. Rev. B 38, 26 (1988).
14. T. Girardeau, J. Mimault, M. Jaouen, P. Chartier, and G. Tourillon, Phys. Rev. B 46, 7144 (1992).
15. W. L. Schaich, Phys. Rev. B 29, 6513 (1984).
16. M. Qian, M. Sarikaya, and E. A. Stern, Ultramicroscopy 68, 163 (1997).
17. D. Haskel, M. Qian, E. A. Stern, and M. Sarikaya, J. Phys. IV C2 7, 577 (1997).
18. D. E. Sayers, E. A. Stern, and F. W. Lytle, Phys. Rev. Lett. 27, 1024 (1971).
19. E. A. Stern, Phys. Rev. B 10, 3027 (1974).
20. P. A. Lee and J. B. Pendry, Phys. Rev. B 11, 2795 (1975).
21. E. A. Stern and W. M. Heald, in Basic Principles and Applications of EXAFS, Handbook of Synchrotron Radiation (North- Holland, New York, 1993).
22. E. A. Stern, in X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS, and XANES, edited by D. C. Konigsberger and R. Prins (Wiley, New York, 1988).
23. M. Newville, P. Livins, Y. Yacoby, J. J. Rehr, and E. A. Stern, Phys. Rev. B 47, 14 136 (1993).
24. J. J. Rehr, C. H. Booth, F. Bridges, and S. I. Zabinsky, Phys. Rev. B 49, 12 347 (1994).
25. M. Newville, B. Ravel, D. Haskel, J. J. Rehr, E. A. Stern, and Y. Yacoby, Physica B 208/209, 154 (1995).
26. M. Vaarkamp, I. Dring, R. J. Oldham, E. A. Stern, and D. C. Koningsberger, Phys. Rev. B 50, 7872 (1994).
27. A. I. Ankudinov and J. J. Rehr, J. Phys. IV C2 7, 121 (1997).
28. E. Sevillano, H. Meuth, and J. J. Rehr, Phys. Rev. B 20, 4908 (1979).
29. J. C. H. Spence and J. Taftø, J. Microsc. 230, 147 (1982).
30. J. Max, Méthodes et Techniques de Traitement du Signal et Applications aux Mesures Physiques (Masson, Paris, 1971).
31. T. Sikora, M. Jaouen, and G. Hug, Philos. Mag. A 79, 2157 (1999).
32. A. V. Poiarkova and J. J. Rehr, Phys. Rev. B 59, 948 (1999).
33. A. V. Poiarkova and J. J. Rehr, J. Synchrotron Radiat. 6, 313 (1999).