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Volumn 3019, Issue , 1997, Pages 183-188

Characterization of a fully depleted CCD on high resistivity silicon

Author keywords

Astronomical; CCD; Fully depleted; High resistivity; Lawrence Berkeley National Laboratory; Lick observatory

Indexed keywords

ABSORPTION SPECTROSCOPY; CHARGE COUPLED DEVICES; CHARGE TRANSFER; COSMOLOGY; EFFICIENCY; INFRARED DEVICES; OBSERVATORIES; SILICON; SOLID-STATE SENSORS; SUBSTRATES;

EID: 0000287398     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.275174     Document Type: Conference Paper
Times cited : (16)

References (3)
  • 2
    • 0024619605 scopus 로고
    • Fabrication of detectors and transistors on high-resistivity silicon
    • S. Holland, "Fabrication of detectors and transistors on high-resistivity silicon," Nuclear Instrum. Methods, A275, 537, 1989.
    • (1989) Nuclear Instrum. Methods , vol.A275 , pp. 537
    • Holland, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.