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Volumn 76, Issue 13, 2000, Pages 1743-1745

Crystallographic and magneto-optical studies of nanoscaled MnSb dots grown on GaAs

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EID: 0000276856     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126153     Document Type: Article
Times cited : (32)

References (24)
  • 2
    • 4243192506 scopus 로고    scopus 로고
    • J. Shi, J. M. Kikkawa, R. Proksh, T. Schaffer, D. D. Awschalom, G. Medeiros-Ribeiro, and P. M. Petroff, Nature (London) 377, 707 (1995); J. Shi, S. Gider, K. Babcook, and D. D. Awschalom, Science 271, 937 (1996).
    • (1996) Science , vol.271 , pp. 937
    • Shi, J.1    Gider, S.2    Babcook, K.3    Awschalom, D.D.4
  • 18
    • 85037516311 scopus 로고    scopus 로고
    • We estimated the thickness of MnSb by the following: d D(525 nm) t/T(525 nm), where d: the requisite thickness, t: the growth time, T: the deposition time needed for the growth of thick film of 525 nm. D (525 nm) was verified by cross-sectional analysis of the MnSb thick film of scanning electron microscopy
    • We estimated the thickness of MnSb by the following: d D(525 nm) t/T(525 nm), where d: the requisite thickness, t: the growth time, T: the deposition time needed for the growth of thick film of 525 nm. D (525 nm) was verified by cross-sectional analysis of the MnSb thick film of scanning electron microscopy.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.